School of Advanced Sciences (SAS)
Facilities
SAS Facilities
$noimg = $base_url.'sites/default/files/default_images/empty-image_0.jpg'; ?>
- HIGH-RESOLUTION MASS SPECTROMETRY (HRMS)
- NMR Spectrometer - 400 MHz (Bruker)- funded by DST-FIST
- Transmission Electron Microscope (TEM) - FEI-Tecnai G2 20 Twin [HR-TEM]
- GC-MS - Perkin Elmer
- FT-IR Spectrophotometer
- Powder X-ray Diffractometer – (Bruker, D8 Advance) – funded by DST-FIST
- Surface Area Analyzer - Quantachrome USA
- Thermo Gravimetry Analyzer (TGA) - TA Instruments, USA
- CHNS Elemental Analyzer - Perkin Elmer - 2400 CHNS/O Series
- Total Organic Carbon Analyzer (Shimadzu)
- Nd:YAG laser, 1000 mJ (max), 1064 and 532 nm, 10 ns, 10 Hz, with vibration isolation support – Model: LPY 674G-10, LITRON, UK.
- UV Visible Spectrophotometer – JASCO (V-670 PC)
- Single Crystal X-ray Diffraction Facility (SC-XRD) - To Avail this Facilities - Click Here
Other Instrumental Facilities:
- Raman Spectroscopy ( = 536 nm) – Agiltron, USA
- Gas Chromatograph – Shimadzu
- Fluorescence Spectrophotometer– HITACHI
- HPLC – Perkin-Elmer
- Electrochemical Workstation – CHI 660C, USA
- Materials Testing Machine – H5KS, Tinius Olsen Ltd, UK
- Refractive Index Measurement setup-Prism Coupler –Metricon, USA
- Mitutoyo Microhardness Tester-with Vicker's & Knoop Indenter – CCD Camera
- Time domain reflectometry – Agilent Technologies, USA
- Simultaneous Thermal Analyzer – SDTQ600, TA Instruments
- Water contact angle measurement (Gonimetry) – Phoenix 300, SEO, Korea
- Electrolytic polishing and etching machine – Struers Lectropol 5